Effect of experimental noise on recovery of the electronic density of states from transient photocurrent data

Steve Reynolds, Charlie Main, Mariana J. Gueorguieva

Research output: Contribution to journalConference article

Abstract

The effects of random noise on density of states determination from transient photocurrent data are examined by superimposing noise levels similar to those found experimentally (1% to 20%) on computer-simulated current-time data. Mathematically approximate methods based on Fourier and Laplace transformations are found to operate effectively at noise levels of up to 20%. Mathematically exact methods offer higher resolution, but this is compromised by greater susceptibility to noise. A Tikhonov regularisation method yields both high resolution and good noise tolerance.

Original languageEnglish
Article numberA22.6
JournalMaterials Research Society Symposium - Proceedings
Volume664
DOIs
Publication statusPublished - 2001
EventAmorphous and Heterogeneous Silicon Based Films 2001 - San Francisco, CA, United States
Duration: 16 Apr 200120 Apr 2001

Fingerprint

Electronic density of states
Photocurrents
photocurrents
recovery
Recovery
noise tolerance
electronics
Laplace transformation
high resolution
Fourier transformation
random noise
magnetic permeability

Cite this

@article{1cda6df218764baf832fd12f2e43b216,
title = "Effect of experimental noise on recovery of the electronic density of states from transient photocurrent data",
abstract = "The effects of random noise on density of states determination from transient photocurrent data are examined by superimposing noise levels similar to those found experimentally (1{\%} to 20{\%}) on computer-simulated current-time data. Mathematically approximate methods based on Fourier and Laplace transformations are found to operate effectively at noise levels of up to 20{\%}. Mathematically exact methods offer higher resolution, but this is compromised by greater susceptibility to noise. A Tikhonov regularisation method yields both high resolution and good noise tolerance.",
author = "Steve Reynolds and Charlie Main and Gueorguieva, {Mariana J.}",
year = "2001",
doi = "10.1557/PROC-664-A22.6",
language = "English",
volume = "664",
journal = "Materials Research Society Symposium Proceedings",
issn = "0272-9172",
publisher = "Cambridge University Press",

}

Effect of experimental noise on recovery of the electronic density of states from transient photocurrent data. / Reynolds, Steve; Main, Charlie; Gueorguieva, Mariana J.

In: Materials Research Society Symposium - Proceedings, Vol. 664, A22.6, 2001.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Effect of experimental noise on recovery of the electronic density of states from transient photocurrent data

AU - Reynolds, Steve

AU - Main, Charlie

AU - Gueorguieva, Mariana J.

PY - 2001

Y1 - 2001

N2 - The effects of random noise on density of states determination from transient photocurrent data are examined by superimposing noise levels similar to those found experimentally (1% to 20%) on computer-simulated current-time data. Mathematically approximate methods based on Fourier and Laplace transformations are found to operate effectively at noise levels of up to 20%. Mathematically exact methods offer higher resolution, but this is compromised by greater susceptibility to noise. A Tikhonov regularisation method yields both high resolution and good noise tolerance.

AB - The effects of random noise on density of states determination from transient photocurrent data are examined by superimposing noise levels similar to those found experimentally (1% to 20%) on computer-simulated current-time data. Mathematically approximate methods based on Fourier and Laplace transformations are found to operate effectively at noise levels of up to 20%. Mathematically exact methods offer higher resolution, but this is compromised by greater susceptibility to noise. A Tikhonov regularisation method yields both high resolution and good noise tolerance.

UR - http://www.scopus.com/inward/record.url?scp=0035556482&partnerID=8YFLogxK

U2 - 10.1557/PROC-664-A22.6

DO - 10.1557/PROC-664-A22.6

M3 - Conference article

AN - SCOPUS:0035556482

VL - 664

JO - Materials Research Society Symposium Proceedings

JF - Materials Research Society Symposium Proceedings

SN - 0272-9172

M1 - A22.6

ER -